Solar Cell Characterisation and Testing

Solar Simulators and Environmental Testing  

Equipment:Institution:Description:
AM 1.5 Solar Simulator University of Edinburgh Current and voltage measurements of PV material under simulated solar radiation.
Small Area Solar Simulator Heriot-Watt University Current and voltage measurements of PV materials under simulated solar radiation. (20 cm x 20 cm) Class AAA.
Environmental Test Chamber Heriot-Watt University Expose and test samples under simulated irradiance and humidity with in-situ optical and electrical measurements.
Large Area Solar Simulator Heriot-Watt University Current and voltage measurements of PV material under simulated solar radiation. (100 cm x 100 cm). Class BAA.
K. H. Steuernage solar Simulator University of St Andrews AM 1.5G Spectrum, 2-UV blocking filters, 4 metal grid neutral density filters.
Newport 92250A Solar Simulator University of Strathclyde Class AAA solar simulator.

 

Additional Testing Equipment

Equipment:Institution:Description:
Spectral Response System Heriot-Watt University External efficiency (EQE) and internal quantum efficiency (IQE) measurements. 
Large Area EQE System Heriot-Watt University External efficiency (EQE) and internal quantum efficiency (IQE) measurements. 10 cm x 10 cm sample dimensions. 300 - 900 nm range.
Lifetime Flash Tester Heriot-Watt University Analysis of carrier recombination lifetime in a photovoltaic cell.
Keithley 2400 source measurement unit (PCE) University of St Andrews Used in combination with K. H. Steuernagel solar simulator for power conversion efficiency measurements of solar cells,
Bentham TMc300 Monochromator, MPL calibrated photodiode and KeithleyPico-ammeter. (IPCE) University of St Andrews Measure incident photon to charge carrier efficiency (IPCE). This shows how electrically sensitive a solar cell is to light.  
Scanning Near-field Optical Microscope, Alpha SNOM University of St Andrews Imaging of samples. Operated in reflection and transmission, confocal reflection and transmission, fluorescence imaging, atomic force microscopy and scanning near field optical microscopy.