Electronic and Materials Characterisation

Atomic Structure

Equipment:Institution:Description:
PANalytical X'Pert Pro powder diffractometer Powder XRD  University of Strathclyde X-Ray diffraction of powder samples to obtain crystal strcuture. 

 

Electrical Properties

 

Equipment:Institution:Description:
Electrochemical Impedance Spectroscopy University of Edinburgh Analysis of a sample‚Äôs response to the application of a small ac signal. Characterisation of electrode processes and complex interfaces. 
Cyclic and differential pulse voltammetry  University of Edinburgh  Investigate the electrochemical properties of an analyte in solution.
Spectroelectrochemistry University of Edinburgh  Provides spectroscopic analysis of electrgenerated compounds, including electronic absorption, light emission and scattering, and magnetic resonance. 
4-Point Probe Heriot-Watt University Resistivity measurements for semiconducting and conducting samples.
Keithly 4200 semiconductor analyser University of Strathclyde Electronic characterisation of organic photovoltaics. 
Ivium Potentiostat University of the West of Scotland  Electrochemical measurements and electrical impedance spectroscopy. 
Voltlab 40 Potentiostat  University of the West of Scotland  Electrochemical measurements and electrical impedance spectroscopy .
Four Point Probe Station University of the West of Scotland   Sheet resistance measurements of tin films. 
Network Analyser University of the West of Scotland   Measure piezoelectric device performance. 
Laser vibrometer University of the West of Scotland  Measure piezoelectric device performance. 
Impedance Analyser University of the West of Scotland  Measure piezoelectric device performance.  
Electrical Probe Station University of the West of Scotland Electrical device measurement. 

 

Morphological Analysis

Equipment:Institution:Description:
Atomic Force Microscope (AFM) University of St Andrews High resolution force microscope for morphological studies. 
Profilometer University of St Andrews  Thickness measurements >20 nm.
Hysitron Atomic Force Microscope/Nanoindentation University of the West of Scotland  High resolution imaging of surface features, hardness and young's modulus measurements ion ting films.
Leica/Nion Optical Microscopes University of the West of Scotland   Optical microsocopy  and Nomarski microscopy.

 

Structural Properties

Equipment:Institution:Description:
Mecmesin Adhesion Tester University of the West of Scotland  Analyse adhesion of thin films to substrates. 
MX303 Wafer Geometry University of the West of Scotland   Stress measurements in thin films. 
Wear Tester University of the West of Scotland Wear testing of coatings.
Impact Tester University of the West of Scotland   Impact testing of coatings.  

 

Other Electronic and Materials Characterisation

Equipment:Institution:Description:
Electron Paramagnetic Resonance University of Edinburgh Excitation of electron spins to study materials with unpaired electrons, with high analytical specificity.
GouchHouse&Go 750-D automatic spectro-radiometric measurement University of Strathclyde  Custom built spectrophotometer for characterisation of light sensing detectors, efficiency measurements based on input light. Output can be scatter light, transmitted light or photocurrent. 
SC Technology Plasma emission spectrometer University of the West of Scotland  High resolution optical emission monitor
Scientific Syste,s Smarprobe Langmuir Probe University of the West of Scotland Ion density, electron density, electron temperature measurements.
CCR Technology CEA4 Faraday Cup University of the West of Scotland   Ion current density, ion energy measurements. 
MKS HPQ2 RGA University of the West of Scotland   Mass spectrometer for measuring residual gas composition in a vacuum chamber.
FLIR infrared camera University of the West of Scotland  Remote temperature measurement and mapping.